The surface quality of the workpiece directly affects its service life and performance. With the progress of science and technology and the development of society, people have higher and higher requirements for the surface quality of the workpiece, and the surface topography measurement technology is also developing rapidly.

At present, among the surface topography measurement methods, mechanical stylus measurement, microinterferometry and SPM technology are the most widely used in scientific research and industrial fields. These three methods can achieve high measurement resolution and accuracy. ZYS XM series surface profile measuring instrument is based on the original technology of ZYS, absorbing the advanced experience of similar instruments at home and abroad, and is gradually improved through continuous improvement. It is used to measure the surface microscopic and macroscopic geometric shapes of various mechanical parts. ZYS XM200 profiler won the second prize of mechanical industry scientific and technological progress in 2008, and has 3 invention patents and 1 appearance patent.It can not only measure the analysis and evaluation parameters of various contour deviations, waviness, roughness in GB3505, but also include special dimensional parameters such as groove deviation, curvature deviation, groove size, convexity, logarithmic curve, spherical base surface radius, lock height, and double groove center distance unique in the bearing industry.